ZHANG Feng, YAN Bin, LI Jian-xin, LI Lei, BAO Shang-lian. Review of Scatter Correction on X-Ray Industrial Computed Tomography[J]. CT Theory and Applications, 2009, 18(4): 34-43.
Citation:
ZHANG Feng, YAN Bin, LI Jian-xin, LI Lei, BAO Shang-lian. Review of Scatter Correction on X-Ray Industrial Computed Tomography[J]. CT Theory and Applications, 2009, 18(4): 34-43.
ZHANG Feng, YAN Bin, LI Jian-xin, LI Lei, BAO Shang-lian. Review of Scatter Correction on X-Ray Industrial Computed Tomography[J]. CT Theory and Applications, 2009, 18(4): 34-43.
Citation:
ZHANG Feng, YAN Bin, LI Jian-xin, LI Lei, BAO Shang-lian. Review of Scatter Correction on X-Ray Industrial Computed Tomography[J]. CT Theory and Applications, 2009, 18(4): 34-43.
The scattering phenomenon has an important influence on the reconstructed image in industrial X-CT imaging systems,and is a hot research on CT all the time.With the latest developments in industrial CT system, cone-beam CT is also increasingly widely used.But because of its high imaging quality,two-dimensional distributional scattering and applications of new type Flat-panel detectors,scatter correction has changed greatly. In recent years,a lot of new correction methods have arisen based on the traditional methods.Firstly,this paper analyzes the reason for the formation of scatter interfere,and investigates the evaluation methods;Secondly,the paper summarizes the major correction methods.At last,the study to scatter correction is looked forward.
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