ISSN 1004-4140
CN 11-3017/P
Volume 18 Issue 3
Sep.  2009
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ZHANG Wei-bin, DAI Bin, TIAN Yong, HUANG Hui, YANG Cun-feng, ZONG He-hou, LI Hong-zhen. Experiment Study on Micron Crystal Defect of Explosive Based on μVCT[J]. CT Theory and Applications, 2009, 18(3): 60-65.
Citation: ZHANG Wei-bin, DAI Bin, TIAN Yong, HUANG Hui, YANG Cun-feng, ZONG He-hou, LI Hong-zhen. Experiment Study on Micron Crystal Defect of Explosive Based on μVCT[J]. CT Theory and Applications, 2009, 18(3): 60-65.
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Experiment Study on Micron Crystal Defect of Explosive Based on μVCT

  • Institute of Chemical Material, CAEP. Mianyang 621900, China

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  • Received Date: May 26, 2009
  • Available Online: December 14, 2022
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    • Abstract
  • The inner defect of explosive crystal is one of the key factors that affect the performance of explosive material.The structure of typical crystal explosive(HMX) is studied with microfocus x-ray industrial volume CT(μVCT) and the micro hole ratio is quantificationally analyzed in this paper.The results indicate that micron holes are extensively presented in HMX crystal and the micro hole ratio is up to 1%~2%,which reveal initial damage existence in explosive parts and the difference between theoretical density and actual density of crystal.The micro hole of HMX crystal may reduce effectively and density and performance are improved after a certain technical treat.The inner structure and micro hole ratio measurement can be effectively studied with μVCT for HMX crystal over tens of micron.This research provides an intuitionistic reliable experimental means for studying molding performance and damage destruction mechanism of explosive parts.
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