ISSN 1004-4140
CN 11-3017/P
王关, 姜怀州, 廉威. 岛津SCT-3000TE高压故障检修[J]. CT理论与应用研究, 2001, 10(2): 19-20.
引用本文: 王关, 姜怀州, 廉威. 岛津SCT-3000TE高压故障检修[J]. CT理论与应用研究, 2001, 10(2): 19-20.
Wang Guan, Jiang Huaizhou, Lian Wei. Repairing High Voltage Malfunction of Shimadzu SCT-3000TE[J]. CT Theory and Applications, 2001, 10(2): 19-20.
Citation: Wang Guan, Jiang Huaizhou, Lian Wei. Repairing High Voltage Malfunction of Shimadzu SCT-3000TE[J]. CT Theory and Applications, 2001, 10(2): 19-20.

岛津SCT-3000TE高压故障检修

Repairing High Voltage Malfunction of Shimadzu SCT-3000TE

  • 摘要: 本文介绍一例岛律SCT-3000TE高压检修特殊故障的方法,说明KV波纹大对X线量影响较大,使图象质量变差。原则上mA越高,X线量越大,接收信号越强,但是,KV波纹大,低能光子数量增加,到达探测器的高能光子数减少,对X线量影响更大。我们测得故障时的KV波纹,虽然峰值正常,但波纹大,变化范围60%,正常时应小于10%,所以探测器测得的线量严重不足,引起图象质量变差。

     

    Abstract: The paper introduce a method that repairig high voltage malfunction of SHIMADZU SCT-3000TE. That indicate KV ripple affect obviously mA value, the more X-ray photon number, the stronger of accepted signal, but the more KV ripple, the more low energy photon, the less high energy photon, the less photon that arrived at the detector. When malfunction has happened, although the KV average value is normal, but the range of KV ripple change 60%, out of tolerance (less than 10%), so the photon that detected is too low, debase the image quality.

     

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