摘要:
在工业X-CT成像系统中,散射现象对重建图像的质量有重要的影响,一直是CT研究的热点之一。随着工业X-CT系统的最新发展,锥束CT也逐渐被广泛应用,由于成像质量要求高,散射成二维分布,及新型平板探测器的应用,对散射校正带来更大的挑战。在传统的散射校正方法基础上,近几年出现了众多新的校正方法。本文首先分析了散射干扰的形成原理,介绍了散射评估方法,同时又对目前主要的几种校正方法进行了归纳总结,并对散射校正研究的发展趋势进行了展望。
Abstract:
The scattering phenomenon has an important influence on the reconstructed image in industrial X-CT imaging systems,and is a hot research on CT all the time.With the latest developments in industrial CT system, cone-beam CT is also increasingly widely used.But because of its high imaging quality,two-dimensional distributional scattering and applications of new type Flat-panel detectors,scatter correction has changed greatly. In recent years,a lot of new correction methods have arisen based on the traditional methods.Firstly,this paper analyzes the reason for the formation of scatter interfere,and investigates the evaluation methods;Secondly,the paper summarizes the major correction methods.At last,the study to scatter correction is looked forward.
下载:
